STUDY ON EHL OIL FILM BEHAVIOR OF TEXTURED SURFACE BY THREE-WAVELENGTH INTERFEROMETRY METHOD
Junji Murata  1, *, @  , Shigeo Kamamoto  1, @  , Yuki Shishihara  1, @  , Takashi Izumi  2, @  , Mamoru Tohyama  2, @  
1 : JTEKT CORPORATION
24-1 Kokubuhiganjo-cho, Kashiwara, Osaka 582-8588 Japan -  Japan
2 : Toyota Central R&D labs., Inc.,
41-1 Yokomichi, Nagakute, Aichi 480-1118 Japan -  Japan
* : Corresponding author
Subject : : oral
Topics : P4-4 Texturing I
Keywords : EHL ; textre ; thickness ; three wavelength interferometry
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